The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 16, 1998
Filed:
Feb. 21, 1996
Advantest Corporation, Tokyo, JP;
Abstract
A short-width pulse generating apparatus for use in measurement of a reflection point, a sampling apparatus for use in measurement of a a reflection point, and a reflection point measuring apparatus each being able to specify a reflection position produced in an integrated high-frequency circuit or a reflection point produced in the inside of an optical element with high accuracy are provided. A short-width pulse generation apparatus comprises short-width optical pulse generating means for generating an optical probe pulse having a narrow pulse width and photoelectric conversion means for producing a short-width electric pulse on a signal transmission line when irradiated with an optical probe pulse, and a sampling apparatus comprises variable delay means for sequentially delaying an optical probe pulse and second photoelectric conversion means for sampling an electric potential on the signal transmission line by being irradiated with an optical probe pulse delayed by the variable delay means. A reflection point measuring apparatus comprises a combination of the short-width pulse generating apparatus and the sampling apparatus.