The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 09, 1998
Filed:
Aug. 29, 1996
Mishio Hayashi, Nerima-ku, JP;
Advantest Corporation, Tokyo, JP;
Abstract
A fractional time frequency measuring apparatus includes a divider for dividing a frequency of a signal to be measured with a predetermined division factor; a counter unit for counting the divided signal with a standard clock for every period of the divided signal and outputting count results; a fractional time measuring unit for measuring fractional times produced by the counting with the standard clock; a sequence control unit to form a sequence circuit for sequentially counting the divided signal with the standard clock; a memory unit for holding the count results from the counter unit; a microprocessor for determining a value of the divisional factor, generating a reset signal, and calculating the frequency of the signal to be measured from the count results stored in the memory unit. The sequence control unit counts a predetermined number of pulses of the standard clock while it generates a write signal of count results in the memory unit, a reset signal for the counter unit, and an address signal for the memory unit; and the counter unit is preset at a value equal to the predetermined number of pulses.