The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 02, 1998

Filed:

Jun. 06, 1996
Applicant:
Inventors:

Naoyuki Yoshida, Kobe, JP;

Hiroyuki Takamatsu, Kobe, JP;

Shingo Sumie, Kobe, JP;

Yutaka Kawata, Kobe, JP;

Hidehisa Hashizume, Kobe, JP;

Futoshi Ojima, Kobe, JP;

Yuji Hirao, Kobe, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R / ;
U.S. Cl.
CPC ...
324765 ; 324752 ;
Abstract

In addition to microwave and excitation light, bias light as well is irradiated upon a surface of a semiconductor sample that is passivated using a solution which contains an electrolyte. Irradiation of the bias light increases the quantity of ionic substances that exist in the solution, largely changes a surface potential of the semiconductor sample, and suppresses surface recombination. This makes it possible to measure the lifetime of carriers which exist within the semiconductor sample at a high accuracy, without influenced by surface recombination.


Find Patent Forward Citations

Yoshida, Naoyuki. (1998). Method of and apparatus for measuring lifetime of carriers in (U.S. Patent No. 5760597). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5760597

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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