The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 26, 1998
Filed:
Jun. 21, 1996
Kazushige Shimogama, Gyoda, JP;
Hiromi Oshima, Saitama, JP;
Advantest Corp., Tokyo, JP;
Abstract
A semiconductor test system facilitates failure analysis of memory devices by being able to switch one situation where expected data used for an address fail memory is the same as data showing charge/discharge states in the memory cells of a memory device under test and another situation where the expected data is the same as data showing the expected output data of the device under test. For doing this, the semiconductor test system includes a prohibit means 7 for prohibiting the output of the an area inversion memory 22 from transferring to later stages, and an exclusive OR gate 6 which receives an output of the prohibit means 7 at one input and an output of an exclusive OR gate 23 at another input. The exclusive OR gate 6 supplies a resulted output to an address fail memory 5.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile