The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 26, 1998

Filed:

Sep. 25, 1996
Applicant:
Inventors:

Kunitoshi Nishimura, Ibaraki, JP;

Kazuhiko Hidaka, Ibaraki, JP;

Assignee:

Mitutoyo Corporation, Kanagawa, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B / ;
U.S. Cl.
CPC ...
73105 ; 33558 ; 33561 ;
Abstract

A touch probe which includes a fixed member, a movable member, a stylus, a bias means, and a reseat position system which permits the fixed member and the movable member to make contact with each other at pairs of contact points at positions which are spaced from one another. In the reseat position system, piezoelectric elements are provided which cause the fixed member and the movable member to move relatively in directions constrained by said pairs of contact points after a force applied to the movable member is removed. This realizes a touch probe which can secure high position reproducibility for a long period of time even if frictional forces act between the fixed member and the movable member.


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