The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 05, 1998
Filed:
Jul. 23, 1996
Applicant:
Inventors:
Assignee:
Wacker Siltronic Gesellschaft fur Halbleitermaterialien AG, Burghausen, DE;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
C30B / ;
U.S. Cl.
CPC ...
117 14 ; 117 13 ; 117 15 ; 117201 ;
Abstract
A method and a device is provided for determining the diameter of a monocrystal growing at a crystallization boundary during the pulling of the monocrystal from a melt. The method includes imaging a part of the crystallization boundary on at least one mirror, observing the mirror image and determining the diameter of the monocrystal from the observed relative position of the crystallization boundary on the mirror image.
Von Ammon, Wilfried. (1998). Method for determining the diameter of a growing monocrystal (U.S. Patent No. 5746825). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5746825
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