The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 05, 1998
Filed:
Jul. 18, 1995
Michael K Hanafey, Wilmington, DE (US);
Scott Anthony Sebastian, Hockessin, DE (US);
Scott Valray Tingey, Elkton, MD (US);
E. I. du Pont de Nemours and Company, Wilmington, DE (US);
Abstract
A novel method of identifying genetic markers linked to alleles conferring yield potential of a crop species has been developed. By conducting genetic marker analysis of a set of current elite lines and the ancestral population from which they were derived by decades of plant breeding, one can determine and compare the expected and observed allele frequencies within elite populations at numerous polymorphic loci. Since the traditional plant breeding effort has consistently utilized yield as a selection criteria, deviations from expected allele frequency at certain loci have been used to identify alleles that confer yield potential. Agronomically superior progeny can, therefore, be selected utilizing genetic markers.