The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 28, 1998
Filed:
Dec. 22, 1992
Applicant:
Inventors:
David Clifford Long, Wappingers Falls, NY (US);
John Blake Pavelka, Beacon, NY (US);
Karl Friedrich Stroms, Las Vegas, NV (US);
Gerhard Weiss, deceased, late of LaGrangeville, NY (US);
Assignee:
International Business Machines Corporation, Armonk, NY (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
356376 ; 356371 ;
Abstract
The present invention relates generally to a new apparatus and a method for non-destructive inspection and/or measurement. And, more particularly, the invention encompasses an apparatus that has a flexible foil or membrane secured thereto which conforms to the surface of the part that is being inspected and/or measured in a nondestructive manner using differential pressure.