The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 10, 1998
Filed:
Oct. 07, 1994
Richard J Nathan, Morgan Hill, CA (US);
James J Lan, Fremont, CA (US);
Steve S Chiang, Saratoga, CA (US);
Paul Y Wu, San Jose, CA (US);
Robert Osann, Jr, Los Altos, CA (US);
Prolinx Labs Corporation, San Jose, CA (US);
Abstract
A device-under-test card includes a matrix of fuses and/or antifuses formed as part of a multi-layered structure. The matrix of fuses and/or antifuses can be electrically programmed to connect any one of first electrical contacts to any one of second electrical contacts and so allows the device-under-test card to act as a junction between burn-in board traces couplable to signal drivers and/or receivers and burn-in board traces couplable to terminals of a device-under-test. The device-under-test card also includes a discrete resistor or alternatively a resistor ladder that permits a terminal of a device-under-test to be coupled to a power or ground terminal or to any combination of resistances including a short, in addition or as an alternative to any one of various signal drivers and/or receivers.