The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 03, 1998

Filed:

Oct. 15, 1996
Applicant:
Inventor:

Carl A Zanoni, Middlefield, CT (US);

Assignee:

Zygo Corporation, Middlefield, CT (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B / ; G01B / ;
U.S. Cl.
CPC ...
356349 ; 356351 ; 356358 ;
Abstract

An interferometric system for measuring motions of a stage 16 relative to fixed reflectors 24, 25 comprises a source 10 of a single frequency, linearly polarized, frequency stabilized light beam which is launched into an optical fiber 12 to deliver the beam to a module 14 on the moving stage 16. The module 14 contains an acousto-optical device 42 or single to two frequency generator, for generating a beam with a frequency difference between the two orthogonal polarization components states of the beam exiting the generator 42, as well as beam shaping and splitting optics 40, 46, a pair of interferometers 52, 54, optical mixers, and focusing optics 32, 34 for launching the output beams 55, 57 of the interferometers 52, 54 onto optical fibers 26, 28 which deliver the interference signals to photoelectric detectors 36, 38 and processing electronics which provide data for the stage 16 motion.


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