The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 10, 1998
Filed:
Jul. 22, 1996
Masanari Koguchi, Higashi-kurume, JP;
Hiroshi Kakibayashi, Nagareyama, JP;
Hiroyuki Tanaka, Hitachinaka, JP;
Shigeto Isakozawa, Hitachinaka, JP;
Keiichi Kanehori, Sayama, JP;
Tatsuo Makishima, Tokyo, JP;
Kazutaka Tsuji, Hachioji, JP;
Hitachi, Ltd., Tokyo, JP;
Abstract
A transmission electron microscope has a camera system that is linked to the optical lens system of the electron microscope by linking the number of electron beam scanning lines of the camera system with the zoom function of the optical lens system. Thus, the number of scanning lines increases as the magnification of the transferred image decreases. Further, the specimen under observation is photographed with a constant number of pixels at all times regardless of the magnification of the transferred image by the optical lens system, thus preventing a reduction in the amount of specimen information.