The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 27, 1998

Filed:

Apr. 23, 1996
Applicant:
Inventors:

Meng-Jin Tsai, Pao-Shan Hsiang, TW;

Water Lur, Taipei, TW;

Chin-Lai Chen, Tao-Yuan Hsien, TW;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L / ;
U.S. Cl.
CPC ...
437 67 ; 1566361 ;
Abstract

A method for forming shallow trench isolation without a recessed edge problem is disclosed. The present invention comprises forming a pad oxide layer on a substrate. Next, a silicon nitride layer is formed on the pad oxide, and a sacrificial layer is formed on the silicon nitride layer. A photo-resist layer that defines an active region on the sacrificial layer is applied. Thereafter, the portions of the sacrificial layer, the silicon nitride layer, the pad oxide layer and the substrate are removed to form a trench. Portions of the silicon nitride layer are undercut, and a dielectric layer is formed to fill the trench. The dielectric layer is planarized until the silicon nitride layer is exposed. Finally, the silicon nitride layer and the pad oxide layer are removed.

Published as:

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