The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 13, 1998

Filed:

Jun. 23, 1994
Applicant:
Inventor:

Bradford E Windle, San Antonio, TX (US);

Assignee:

CTRC Research Foundation, San Antonio, TX (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
C12Q / ;
U.S. Cl.
CPC ...
435-6 ; 435-6 ; 935 77 ; 935 78 ;
Abstract

The present invention relates generally to the fields of macromolecule image analysis and interpretation. More particularly, it concerns means for selecting an image, and using unique color vector computer automation to determine the shape, length, and physical characteristics of a stained DNA image midline based on the overall contour. The invention also includes methods of gravitationally stretching DNA to an essentially linear, 2-dimensional form having an inter kilobase pair distance of between 0.34 .mu.m to 0.65 .mu.m per kilobase pair. Examples of color images analyzed are presented and include the mapping of DIRVISH stained DNA markers, orientation, and distances. A novel use of the method allows determination of replication origin and termination sites on the DNA.


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