The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 06, 1998

Filed:

Mar. 05, 1996
Applicant:
Inventors:

Hiroshi Itahara, Atsugi, JP;

Takashi Seike, Atsugi, JP;

Assignee:

Anritsu Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R / ;
U.S. Cl.
CPC ...
364485 ; 364484 ; 364576 ; 364726 ; 324 7619 ; 324 7621 ; 324 7643 ; 324 7645 ;
Abstract

In a frequency spectrum analyzing apparatus which utilizes a DFT (discrete Fourier transform) filter bank, and can detect the peak value of the amplitude of an input signal, a time sequence signal generation circuit samples an input signal to convert it into a time sequence signal. A memory stores the time sequence signal. The DFT filter bank receives a time sequence signal read out from the memory by a control device, and performs DFT filter bank processing corresponding to a plurality of desired frequencies while shifting a window function by a predetermined number of sample point units. An absolute value calculation unit calculates absolute values in units of outputs from the DFT filter bank. A peak value detection unit detects peak values in units of outputs from the absolute value calculation unit. A display device displays the frequency spectrum on the basis of these peak values.


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