The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 28, 1997
Filed:
Sep. 11, 1995
Applicant:
Inventors:
Ikuhiro Yokota, Tokyo, JP;
Shigetaka Kumashiro, Tokyo, JP;
Assignee:
NEC Corporation, Tokyo, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F / ;
U.S. Cl.
CPC ...
364578 ; 364488 ;
Abstract
In order to estimate an initial potential value for semiconductor device simulation at each of iterative procedures a computer system, a plurality of bias conditions are stored in a memory. Following this, one bias condition is retrieved from the memory at a given iterative procedure. Further, an analysis result already obtained in an iterative procedure, which precedes the given iterative procedure, is retrieved from the memory. Subsequently, an initial potential value is estimated which is used in the give iterative procedure by solving a Laplace equation which is weighted by a coefficient including a reciprocal of electric field intensity.