The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 12, 1997
Filed:
May. 26, 1994
Leonard C Swanson, Hopewell, NJ (US);
Martha L Stocking, Hopewell, NJ (US);
Educational Testing Service, Princeton, NJ (US);
Abstract
A method is disclosed for incorporating into the construction of adaptive tests expert test development practices. The method is an application of a weighted deviations model and an heuristic for automated item selection. Taken into account are the number and complexity of constraints on item selection found in expert test development practice. The method of the present invention incorporates content, overlap, and set constraints on the sequential selection of items as desired properties of the resultant adaptive tests, rather than as strict requirements. Aggregate failures are minimized in the same fashion as in the construction of conventional tests. The extent to which restrictions on item selection are not satisfied is then the result of deficiencies in the item pool, as it is with conventional tests.