The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 12, 1997
Filed:
May. 01, 1995
Srimat T Chakradhar, North Brunswick, NJ (US);
Steven G Rothweiler, Kunkletown, PA (US);
Vishwani D Agrawal, Murray Hill, NJ (US);
NEC USA, Inc., Princeton, NJ (US);
Abstract
Techniques for the generation of tests for detecting specified faults in circuits that include non-Boolean components and for identifying these undetectable faults that are logically redundant. The main features are: (1) only one Boolean variable is used to represent the value on a signal and all signals assume only Boolean values during the test generation procedure, (2) function of non-Boolean components is separated into Boolean and non-Boolean states, and energy functions are derived only for the Boolean state, and (3) non-Boolean states are implicitly considered in the energy minimization procedure.