The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 01, 1997

Filed:

Jan. 12, 1995
Applicant:
Inventor:

Kurt E Schmidt, Lindenhurst, IL (US);

Assignee:

Teradyne, Inc., Boston, MA (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04M / ; G01R / ; H04B / ;
U.S. Cl.
CPC ...
379-5 ; 379 22 ; 379 24 ; 379-6 ; 370249 ; 370251 ; 370244 ; 324611 ;
Abstract

Apparatus and method for testing lines. The apparatus is particularly useful for testing lines in a switched network, such as might be used to electronically route telephone and computer data lines to various offices in an office building. The apparatus includes an AC test source and a DC measurement device located at a near end switch. A DC transform circuit is located at a far end switch. According to the test method, an AC test signal is injected onto a line under test at the near end. At the far end, the received signal is converted to DC, which is sent to the near end. Line attenuation, and hence fault conditions, are detected by comparing the DC signal to the transmitted AC signal. Techniques to increase the signal to noise ratio of the DC signal are also disclosed.


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