The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 17, 1997
Filed:
Oct. 03, 1995
Applicant:
Inventors:
Mark J Balmer, Tigard, OR (US);
Mark R Waggoner, Hillsboro, OR (US);
Assignee:
Intel Corporation, Santa Clara, CA (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F / ;
U.S. Cl.
CPC ...
3951 / ; 39518306 ; 371 225 ; 371 226 ; 365201 ;
Abstract
A method and apparatus for providing programmable self-testing in a memory. Registers in the memory are programmed with a sequence of instructions for performing the self-test of the memory. The sequence of instructions is run to perform the self-test of the memory, and the results are checked. The memory includes a clock multiplier which allows the registers to be programmed at a first clock rate, then the memory is tested at a second clock rate which is faster than the first clock rate.
Balmer, Mark. (1997). Programmable built-in self-test function for an integrated circuit (U.S. Patent No. 5640509). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5640509
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile