The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 10, 1997

Filed:

Jun. 29, 1994
Applicant:
Inventors:

Robert F Krick, Beaverton, OR (US);

Peter J DesRosier, Portland, OR (US);

Assignee:

Intel Corporation, Santa Clara, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F / ;
U.S. Cl.
CPC ...
371 225 ; 371 224 ; 371 24 ; 371 251 ;
Abstract

A processor with a built in self test function that provides intermediate self test results is disclosed including at least one logic array and a test circuit for each logic array coupled to generate a logic array signature during a built in self test of the processor. The processor further comprises a set of internal registers including a performance register that stores the logic array signature and a register that stores a pass/fail indication for the built in self test of the processor. The internal registers also store a pass/fail indication for a cache memory built in self test and a pass/fail indication for a constant read only memory built in self test.


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