The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 06, 1997
Filed:
Sep. 20, 1994
Shih-Jong J Lee, Bellevue, WA (US);
Alan C Nelson, Redmond, WA (US);
Larry A Nelson, Bellevue, WA (US);
Carl E Youngmann, Seattle, WA (US);
Keith L Frost, Seattle, WA (US);
NeoPath, Inc., Redmond, WA (US);
Abstract
A cytological system dynamic normalization of a normal threshold. An analysis score from a slide is compared against a threshold to determine whether or not the slide is normal or requires microscopy review. The normal threshold is dynamically adjusted using a three step process. The process is implemented on an automatic cytology system. The first step is initial calibration of the system to determine an initial threshold. The second step is a running adjustment of the normal threshold in response to the presentation of new slides to the automatic cytology system. The third step is the batch certification of every slide. The threshold may be adjusted for an analysis score, a quality control score, or a screening score.