The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 29, 1997

Filed:

Apr. 28, 1995
Applicant:
Inventors:

Yutaka Hayashibe, Omiya, JP;

Yasumasa Sayama, Omiya, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
436 50 ; 436 52 ; 436 55 ; 436 73 ; 436 81 ; 436166 ; 436175 ; 436177 ; 436178 ; 422 62 ; 422 81 ; 422 82 ; 422108 ;
Abstract

A continuous flow analyzing method and an apparatus for carrying out the analyzing method wherein a sample is injected in a continuously flowing carrier and the sample is introduced into a detector by the carrier to thereby perform a quantitative analysis contained in the sample. In the method the sample to be analyzed is filled into a sample introduction switchover valve (SISV); a portion of the sample from the SISV is injected into the carrier and an analysis of this sample is conducted to obtain a detection peak for the analyzed sample. These steps are repeated and the sample is continuously analyzed by, in the case where a detection peak obtained in the detector is under an optimum analysis range, increasing an injection amount of the sample, and in the case where the detection peak obtained in the detector is over the optimum range, decreasing the injection amount of the sample. Adjustment of the detection peak is repeated until the detection peak reaches the optimum analysis range. Since it is possible to precisely control the injection amount of the sample, it is possible to conduct a high precision quantitative analysis. It is possible to apply the method to a sample having a concentration as low as about 1 ng/ml up to a concentration as high as about 1,000 .mu.g/m with the same apparatus system by feeding the results obtained in a detector back to a sample feed system.


Find Patent Forward Citations

Hayashibe, Yutaka. (1997). Continuous flow analyzing method and apparatus (U.S. Patent No. 5624846). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5624846

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