The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 15, 1997
Filed:
Jul. 31, 1995
Keith L Frost, Seattle, WA (US);
Seho Oh, Mukilteo, WA (US);
Jon W Hayenga, Kent, WA (US);
Kim J Hansen, Renton, WA (US);
NeoPath, Inc., Redmond, WA (US);
Abstract
Accurately measuring and controlling the system transfer function of an imaging system, by eliminating interference from aliases. An image is captured of an image primitive with a uniaxial pattern, oriented at an angle to the primary axes of a sampling array. In order to accurately measure the system transfer function, a two-dimensional frequency representation is computed. The aliased components of the representation are separated from the unaliased components by translation in frequency along the axis perpendicular to the axis of the image primitive. Accurate measurement of the system transfer function makes it possible to accurately control the system transfer function.