The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 01, 1997
Filed:
Sep. 19, 1995
Yukitaka Murakami, Fukuoka, JP;
Jeol Ltd., Tokyo, JP;
Abstract
Method of finding the distribution of stresses on and in an elastic body from data about the pattern of a temperature variation pattern on the surface of the elastic body caused by the thermoelastic effect and also from data obtained by numerical analysis of the stresses. First, stress variations are adiabatically given to the actual elastic body. The pattern of temperature variations on the surface of the object caused by the thermoelastic effect is detected. Then, the sums of principal stresses inside the surface of the object are found from the temperature variation pattern. A plurality of free nodal points are established at the boundary of a model of a structure having the same shape as the actual object. A unit external force is applied to certain one of the free nodes. The sums of the resulting stresses at the internal points are found by numerical analysis. The distribution of external forces acting on the free nodes which is closest to the actually measured principal stress sum distribution is found by the principle of superposition and by the least squares method. The stress components acting on arbitrary points on or in the actual object are found by numerical analysis from the obtained external force distribution.