The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 24, 1996

Filed:

Dec. 23, 1993
Applicant:
Inventors:

Hiroshi Saito, Fujisawa, JP;

Yasumichi Suzuki, Yokohama, JP;

Naoyuki Tamura, Kudamatsu, JP;

Assignee:

Hitachi, Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B05D / ; C23C / ; H01L / ;
U.S. Cl.
CPC ...
427553 ; 427595 ; 156345 ; 1566431 ; 1566461 ; 1187 / ; 1187 / ;
Abstract

A plasma processing method for processing a thin film formed on a substrate or forming a thin film on a substrate within a vacuum vessel provides for supplying a gas into the vacuum vessel, producing a plasma in the vacuum vessel by applying a microwave to the gas, and creating a static magnetic field represented by magnetic lines of force parallel to the direction of propagation of the microwave in the vacuum vessel by a magnetic circuit. The field intensity of the static magnetic field is determined taking into consideration the frequency of the microwave so that the same is lower than the field intensity at which electron cyclotron resonance occurs. The magnetic flux density of the static magnetic field is determined, taking into consideration the frequency of the high-frequency wave or the microwave, so that the same is not lower than the magnetic flux density at which electron cyclotron resonance occurs, and the density of the plasma is determined so that the left-hand circularly polarized wave is cut off.


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