The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 12, 1996
Filed:
Jul. 25, 1995
Kee S Kim, Folsom, CA (US);
Intel Corporation, Santa Clara, CA (US);
Abstract
A scan chain and method of generating non-successive pseudo-random test patterns for performing a built-in self test (BIST) on a circuit block in an integrated circuit. The scan chain includes a linear feedback shift register (LFSR) cascaded with a shift register. An output of a last storage element of the shift register is fed back in to an input of a first storage element of the LFSR such that the shift register and LFSR form a circular path. A first test pattern is generated in the scan chain when a data string stored in the shift register is shifted through the LFSR. The test pattern is then asserted on inputs of the circuit block. The circuit response is stored in the scan chain, and the scan chain is shifted once more in order to compress the result and generate a second test pattern simultaneously.