The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 12, 1996
Filed:
May. 12, 1995
Cheng-Ju Hsieh, Hsinchu Hsien, TW;
Chien-Chung Pan, Taichung, TW;
United Microelectronics Corporation, Hsinchu, TW;
Abstract
A test pattern generator accompanying digital integrated circuits for successively generating a plurality of test patterns for a built-in self test. A plurality of shift registers are serially connected in a loop for successively outputting the test patterns in response to a clock signal. At least one logic gate is connected among the shift registers. At least one control means is connected within the loop. Using such a configuration, the shift registers are set to an initial pattern. The shift registers are then set to one of a plurality of test patterns. The test patterns are then successively output through the shift registers in response to the clock signal.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile