The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 29, 1996
Filed:
Jun. 23, 1993
Chi W Yau, Holland, PA (US);
Yervant Zorian, Princeton, NJ (US);
Lucent Technologies Inc., Murray Hill, NJ (US);
Abstract
Control of the self-testing of a plurality of elements (12.sub.1 -12.sub.m), each having a Built-In, Self-Test (BIST) capability, and arranged in one or more groups (14.sub.1 -14.sub.n), is carried out by a network (16) of one or more standard BIST resource interface controllers (SBRICs 18.sub.1 -18.sub.n). Each SBRIC in the network controls the self-testing of the elements in a separate one of the groups in sequence by broadcasting a test command to the elements in parallel which, in response, generate test signatures stored by the SBRIC. The SBRICs in the network are coupled in series in daisy chain fashion to enable the test signatures stored by the SBRICs to be concatenated for easy retrieval by shifting out the test signatures therefrom, using a technique such as boundary scan.