The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 22, 1996

Filed:

Jun. 07, 1995
Applicant:
Inventor:

Tohru Furuyama, Tokyo, JP;

Assignee:

Kabushiki Kaisha Toshiba, Kawasaki, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C / ; G11C / ;
U.S. Cl.
CPC ...
365201 ; 36523003 ; 365226 ;
Abstract

A semiconductor device comprising a plurality of circuit blocks to which various potentials, including at least one potential either raised or lowered, are assigned. The device further comprises means for selectively and reversely changing the potentials assigned to the circuit blocks.


Find Patent Forward Citations

Furuyama, Tohru. (1996). Semiconductor device and method of screening the same (U.S. Patent No. 5568436). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5568436

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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