The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 23, 1996
Filed:
Aug. 10, 1995
John P Connor, Burlington, VT (US);
Stuart J Hall, Underhill Center, VT (US);
Marcel J Robillard, Williston, VT (US);
Luigi Ternullo, Jr, Colchester, VT (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
A circuit, as a logic circuit or a memory circuit, having testing latches. The testing latches include an input latch, a slave latch, and true and complement output latches. The output of the slave latch is NANDed with a DESELECT signal to deselect the output latches. The testing latches can be used in a method of characterizing or testing a memory or logic integrated circuit with scannable output latches. At least one output latch has an input latch, a slave latch, and an output latch which may contain a Complement Latch, and a True latch. In the testing process an output of the slave latch is NANDed with a deselect signal to allow testing or characterization by masking known 'fail' signals.