The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 02, 1996

Filed:

Dec. 30, 1992
Applicant:
Inventors:

Anna Madrid, Phoenix, AZ (US);

Scott Jacobson, Phoenix, AZ (US);

Bidyut K Bhattacharyya, Chandler, AZ (US);

Assignee:

Intel Corporation, Santa Clara, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G04F / ; G01R / ;
U.S. Cl.
CPC ...
368113 ; 324 731 ; 324710 ;
Abstract

A test assembly for testing integrated circuits. The assembly includes a test chip that is located between the integrated circuit (IC) and a tester. The test chip has a very low input capacitance that approximates an open circuit, and has an impedance that matches the impedance of the integrated circuit and tester. The matching impedance of the test chip reduces the amount of signal ringing between the integrated circuit and tester.


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