The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 02, 1996

Filed:

Nov. 24, 1993
Applicant:
Inventors:

Shigeru Hashimoto, Yokohama, JP;

Akihiko Yokoyama, Yokohama, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02B / ; G02B / ; G02B / ;
U.S. Cl.
CPC ...
359359 ; 359589 ; 359653 ; 359722 ;
Abstract

A two-wavelength antireflection film includes a substrate and an alternate film. The alternate film consists of alternately laminated layers of a low refractive index material and an intermediate refractive index material, in order from a light entrance side to the surface of the substrate. The low refractive index material is at least a member selected from the group consisting of MgF.sub.2, SiO.sub.2, BaF.sub.2, LiF, SrF.sub.2, AlF.sub.3, NaF, a mixture thereof and a compound thereof. The intermediate refractive index material is at least a member selected from the group consisting of Al.sub.2 O.sub.3, LaF.sub.3, NdF.sub.3, YF.sub.3, a mixture thereof and a compound thereof.


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