The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 14, 1996

Filed:

Oct. 24, 1994
Applicant:
Inventors:

Rebecca A Miller, Manhattan, KS (US);

Russell C Hoseney, Manhattan, KS (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N / ; G01N / ;
U.S. Cl.
CPC ...
73 81 ; 73169 ;
Abstract

Apparatus (10) is provided for measurement of the toughness of edible products such as breads and cheeses. The apparatus (10) preferably includes a texture analyzer (12) equipped with a load cell crossarm (18); a special sample holding device (14) is mounted on the analyzer (12) and includes a base (30) adapted to hold a sample (88) and equipped with a flexible elongated pull wire (34). A cover assembly (32) is positioned atop the sample (88) and includes retention pins (64-70) to hold the sample in a substantially stationary condition. In use, the pull wire (34) is coupled to crossarm (18) and the analyzer (12) is actuated to elevate the arm (18), thus pulling the wire (34) at least partially through the sample (88). The force required to pull the wire (34) through the sample (88) is taken as a measure of sample toughness.


Find Patent Forward Citations

Miller, Rebecca. (1996). Method and apparatus for determining toughness of baked products (U.S. Patent No. 5515718). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5515718

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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