The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 07, 1996
Filed:
Sep. 06, 1994
Hiroshi Mori, Ohizumi, JP;
Eiji Kimura, Gyoda, JP;
Advantest Corporation, Tokyo, JP;
Abstract
An optical FM characteristics measurement apparatus for measuring the light signal from a laser diode is capable of automatically and precisely determining a frequency discriminating point of the interferometer and maintain the discriminating point during the measurement. The measurement apparatus can distinguish an intensity modulation component from a frequency modulation component in the light signal from the laser diode, therefore, it can improve measurement accuracy and operation efficiency. The measurement apparatus has an interferometer control unit for controlling the interferometer used as an optical frequency discriminator, a processing unit for calculating a discriminating point using output of a photodiode and for storing its value, switches for detecting an increasing point or a decreasing point of the interferometer output based on the discriminating point, a switch for monitoring peak value of the interferometer in real time, and a network analyzer which is capable of analyzing the incoming signal in terms of amplitude and phase.