The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 09, 1996
Filed:
Dec. 16, 1994
Paul G Scardino, Layton, UT (US);
Ringo C Beaumont, Bear River, UT (US);
Morton International, Inc., Chicago, IL (US);
Abstract
An x-ray system and method capable of producing very accurate RTR images corrected for x-ray system inhomogeneities. A three-dimensional correction memory is used to store deviation information relating to system inhomogeneities. The three-dimensional correction memory is indexed by x and y coordinates of the image plane and an attenuation coordinate associated with a plurality of standard samples. The standard samples are exposed in turn, and deviations between the measured attenuation and the nominal attenuation are noted and stored at the x and y coordinates in the attenuation plane for the sample then exposed. The procedure is repeated for a plurality of samples to create a three-dimensional correction array. An object to be imaged creates a set of raw intensity information. The raw information is corrected by accessing the correction memory at the x and y coordinates of each pixel to be corrected and the attenuation coordinate associated with the raw measurement. The deviation information is applied to the raw measurement to produce and store a corrected attenuation factor for each pixel.