The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 05, 1996
Filed:
Sep. 28, 1994
Masahiko Tachikake, Kawasaki, JP;
Masamichi Suzuki, Kawasaki, JP;
Mitutoyo Corporation, Tokyo, JP;
Abstract
A digital display micrometer gauge holds a workpiece to be measured between an anvil and a spindle. An engagement member is provided at an end of the spindle. An inner sleeve having an axial slit into which the engagement member is inserted, is secured to a U-shaped main frame, and an outer sleeve having a spiral groove, which is formed in the inner peripheral section thereof, is provided on the outer periphery of the inner sleeve to be circumferentially rotatable. By rotating this outer sleeve, the spindle can be driven at high speed. A main scale constituting a linear encoder is attached to a side surface of the spindle extending along the axis of the spindle, whereby the displacement amount of the spindle can be detected with high accuracy. A slide member slidable on the inner surface of the inner sleeve is provided at the end of the spindle where the engagement member is provided, and the spindle can be inserted into the inner sleeve together with the main scale attached thereto.