The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 23, 1996

Filed:

May. 20, 1994
Applicant:
Inventors:

Gregory B Hibdon, Folsom, CA (US);

John M Ingram, Sacramento, CA (US);

Assignee:

Intel Corporation, Santa Clara, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R / ;
U.S. Cl.
CPC ...
324537 ; 324538 ; 324 731 ;
Abstract

A testing method for connecting a first group of input conductors to output conductors in which the number of switching devices connected to each output conductor at connections with the group of input conductors are summed individually, the output conductor having the least number of switching devices at these intersections is chosen, and the switching devices are summed for each of the group of input conductors having a switching device at an intersection with the chosen output conductor and the input conductor having the least number of switching devices is selected. A switching device at the intersection of this first selected input conductor and the first selected output conductor is chosen for closure to provide the first connection in the output combination desired. The process is repeated until all of the connections are chosen or one fails.


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