The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 09, 1996
Filed:
May. 12, 1994
Applicant:
Inventors:
James R Neal, Cameron Park, CA (US);
Peter F Brown, Orangevale, CA (US);
Louis W Agatstein, El Dorado Hills, CA (US);
Michael Gutman, Zichron-Ya'acov, IL;
Assignee:
Intel Corporation, Santa Clara, CA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F / ;
U.S. Cl.
CPC ...
257712 ; 257706 ; 257713 ; 395550 ; 395750 ; 361 98 ; 361103 ; 361106 ; 364557 ;
Abstract
A circuit and method for reducing an internal clocking frequency of the semiconductor device upon receiving a first signal indicating that a fan element disposed on the semiconductor device is operating at an unacceptable performance level and/or a second signal indicating that the semiconductor device is operating at a temperature greater than a prescribed boundary temperature.
Neal, James. (1996). Employing on die temperature sensors and fan-heatsink failure signals to (U.S. Patent No. 5483102). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5483102
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile