The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 14, 1995

Filed:

Jun. 09, 1992
Applicant:
Inventors:

Hiroo Watai, Fuji, JP;

Takao Nishida, Kokubunji, JP;

Takaharu Nagumo, Hadano, JP;

Masahiko Nagai, Yamanishi, JP;

Assignee:

Hitachi, Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F / ;
U.S. Cl.
CPC ...
364578 ; 364489 ;
Abstract

A logical operation method for evaluating a train of output data to be obtained when a plurality of input patterns are successively applied to a memory element whose output value depends upon a sequence of input values. For each of the plurality of patterns in time series, the method decides whether or not the pertinent pattern is a holding pattern which means that the output value of the memory element depends upon a preceding pattern. Subsequently, the method evaluates a first train of data which consists of flags each indicating whether or not the respective pattern is the holding pattern, and a second train of data which consist of a predetermined logical values for the holding patterns and output logical values of the memory element for the non-holding patterns. Finally, the method subjects the first and second trains of data to operations in parallel by the use of a parallel arithmetic unit, thereby obtaining the train of output data of the memory element in parallel. High-speed logic/fault simulations can be realized even for a synchronous sequential circuit with the parallel arithmetic unit such as vector computer. This makes it possible to sharply reduce the number of man-hour and shorten the processing period of time in the verification of logic and the generation of test data.


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