The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 11, 1995

Filed:

Dec. 16, 1993
Applicant:
Inventors:

Hiroshi Tanaka, Itami, JP;

Masashi Ohmori, Itami, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
356246 ; 356336 ; 356339 ; 356342 ; 356343 ; 250574 ;
Abstract

A device for analyzing fine particles in a sample gas includes a light source for emitting light, a convergent device for converting the light emitted by the light source into a convergent light beam having a light focus point and an energy density sufficient to dissociate the fine particles to be analyzed. The device also includes a transparent analyzer tube having a window for admitting the convergent light beam and a throat located at the light focus point of the convergent light beam, the analyzer tube receiving the sample gas and passing the sample gas through the throat. The device includes a light collecting device for collecting, through the analyzer tube, light emitted from dissociated fine particles, dissociated by the convergent light beam in the throat of the analyzer tube, and an analyzing device for analyzing the light from the dissociated fine particles collected by the collecting device.


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