The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 13, 1995
Filed:
Apr. 30, 1993
Applicant:
Inventors:
Bruce A Horwitz, Newton, MA (US);
Steven J Wein, Sudbury, MA (US);
Assignee:
Litton Systems, Inc., Lexington, MA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01J / ;
U.S. Cl.
CPC ...
356328 ;
Abstract
An optical system and a method for separating overlapping spectra from a diffraction grating and an imaging spectrometer with increased free spectral range are disclosed. The light from a diffraction grating consists of multiple spectra overlapping each other and displaced along a spectral axis. The invention directs the light from the grating to a refractive element such, as a prism. The prism further disperses the light along the same spectral axis. The individual spectra are sufficiently displaced such that they no longer interfere with each other.