The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 10, 1995

Filed:

Jun. 09, 1993
Applicant:
Inventors:

Hideyuki Kawagishi, Ayase, JP;

Toshihiko Miyazaki, Hiratsuka, JP;

Hisaaki Kawade, Yokohama, JP;

Etsuro Kishi, Kawasaki, JP;

Kiyoshi Takimoto, Isehara, JP;

Toshihiko Takeda, Atsugi, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G11B / ;
U.S. Cl.
CPC ...
369272 ; 3692755 ; 369126 ;
Abstract

An information carrier for performing information recording and/or reproducing through a probe provided in an information recording and/or reproducing apparatus includes an information recording medium having a recording plane for recording and/or reproducing through the probe, and a frame which is formed detachably in the information recording and/or reproducing apparatus to accommodate the information recording medium airtightly. A mechanism is provided in the frame which can be opened or closed to allow the recording plane of the information recording medium to be open when the frame is mounted in the information recording and/or reproducing apparatus. The recording plane of the information recording medium is allowed to face the probe through the opening caused by the mechanism, and this mechanism performs the opening in a closed space formed by the cooperation of the frame and the information recording and/or reproducing apparatus when the frame is mounted in the information recording and/or reproducing apparatus, thereby preventing the property degradation of the recording medium and the probe electrode as well as damage and adhesion of dust particles.


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