The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 10, 1995
Filed:
Oct. 15, 1993
Mishio Hayashi, Tokyo, JP;
Advantest Corporation, Tokyo, JP;
Abstract
A pulse measuring instrument for measuring various pulse signal parameters such as the pulse width, the signal period of an input signal, and the time interval between input signals is capable of measuring the signal parameters with a high degree of accuracy and simplicity by automatically calibrating the propagation time difference between the input signal paths in the circuit configuration in the measuring instrument. The pulse signal measuring instrument is first provided with a calibration signal at the input terminal to obtain calibration data. The calibration data includes various time difference data regarding signal propagation time difference between the different signal paths in the measuring instrument. The calibration data also includes the signal period of the calibration signal and standard pulse width of the calibration signal. The calibration data is stored in a computer in the pulse signal measuring instrument. In a subsequent measurement of an input signal, the measured value of the input signal is compensated by the calibration data so that the signal propagation time difference is canceled.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile