The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 06, 1994
Filed:
Apr. 26, 1989
Chris M Pieper, Hillsboro, OR (US);
Cathie J Wier, Portland, OR (US);
Eric M Bush, Beaverton, OR (US);
Thomas W Rudwick, III, Beaverton, OR (US);
William A Greenseth, Portland, OR (US);
Robert R Klingenberg, Beaverton, OR (US);
David Du Pont, Beaverton, OR (US);
Credence Systems Corporation, Fremont, CA (US);
Abstract
A system manipulates stimulus/response signal data associated with an integrated circuit design, such as from a computer-aided engineering simulator, and converts the data into a format acceptable by a tester device which tests a prototype or production integrated circuit. The data is graphically displayed as a waveform and as a vector sequence. On-screen editing of either display is reflected in the other display. Further, the same displays are used to convert the data from event-based data into cycle-based template data compatible with a tester. A mix between event and state data during the conversion is allowed. A standard frame generation language is presented for defining tester frames for each signal within a template or timeset. A workbench editor provides for icon-based control of the system.