The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 04, 1994

Filed:

Oct. 18, 1993
Applicant:
Inventors:

Yasushi Gotoh, Kokubunji, JP;

Tokuo Kure, Tokyo, JP;

Hiroshi Kawakami, Hachioji, JP;

Masanori Katsuyama, Ome, JP;

Kiyomi Yagi, Hamura, JP;

Hiromichi Enami, Tachikawa, JP;

Assignee:

Hitachi, Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L / ; B44C / ; C03C / ; C03C / ;
U.S. Cl.
CPC ...
156643 ; 156657 ; 156662 ; 156345 ;
Abstract

Disclosed is an etching method and an apparatus for performing an etching by alternately and repeatedly switching an average thickness of an ion sheath and an average energy of etching ions between two different values. Since the etchant absorption to the surface of an article to be etched and the etching by ions are effectively performed, it is possible to reduce the influence of an aspect ratio on an etching depth, and hence to perform the etching with an equal depth even if the width of the opening is changed.


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Gotoh, Yasushi. (1994). Etching method and etching apparatus therefor (U.S. Patent No. 5352324). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5352324

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