The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 30, 1994

Filed:

Jun. 15, 1992
Applicant:
Inventors:

Michael Kuchel, Oberkochen, DE;

Albrecht Hof, Aalen, DE;

Assignee:

Carl-Zeiss-Stiftung, Heidenheim/Brenz, DE;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B / ;
U.S. Cl.
CPC ...
356376 ; 2502 / ;
Abstract

The present invention relates to a method for evaluating fringe images, in particular, for topographic measurements. During a first step, several phase-displaced patterns are recorded sequentially in time, and the respective phase relations of these patterns are determined by evaluation in the spatial domain (14a, 14b, 15). During a second step, after the phase shifts have been determined accurately in this manner based on the video images themselves, a pixel-by-pixel evaluation of the phase-displaced pattern is performed in the time domain. The invention also includes computer hardware for performing the evaluation of the strip images in video real time.


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