The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 30, 1994

Filed:

May. 13, 1992
Applicant:
Inventors:

Richard M Lazarus, Mission Viejo, CA (US);

John J Grunwald, Ramat-gan, IL;

Chava Gal, Ramot Hashavim, IL;

Shulamit Hirsch, Tel-Aviv, IL;

Assignee:

Morton International, Inc., Chicago, IL (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G03C / ;
U.S. Cl.
CPC ...
430270 ; 430326 ; 430192 ; 430193 ;
Abstract

A positive working deep UV sensitive photoresist which provides improved critical dimension stability during prolonged periods of post exposure delay before baking comprises an acid stable polymer which is insoluble in water but normally soluble in an aqueous alkaline medium, a photoinitiator which generates acid upon exposure to actinic radiation, and a mixed carbonate ester of tertiary butyl alcohol and a polyhydric phenol which is an acid labile compound which inhibits the dissolution of the normally soluble polymer in said alkaline medium.


Find Patent Forward Citations

Lazarus, Richard. (1994). Deep uv sensitive photoresist resistant to latent image decay (U.S. Patent No. 5342734). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5342734

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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