The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 07, 1994

Filed:

Aug. 16, 1993
Applicant:
Inventor:

Mishio Hayashi, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G04F / ; G04F / ;
U.S. Cl.
CPC ...
368113 ;
Abstract

A time interval measuring apparatus for measuring a time interval between two input signals and a signal period of either one of the input signals is capable of detecting and canceling the time difference in the signal propagation times between the two signal paths which transmit two input signals to be measured to an inner circuit of the time interval measuring apparatus. The true time interval is calculated by using the first time interval measurement result obtained when the first and second switches are switched to the first and second input terminals respectively, and the second time interval measurement result obtained when the second and first switches are switched to the first and second input terminals respectively, and the signal period of the input signal. The difference between the signal propagation times in the two input signal paths is canceled by the calculation part. The true time interval, the signal period and the phase difference between the input signals are displayed on the display.


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