The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 07, 1994

Filed:

Jan. 16, 1992
Applicant:
Inventors:

Eugene de Juan, Jr, Phoenix, MD (US);

Gary W Jones, Raleigh, NC (US);

Susan K Jones, Raleigh, NC (US);

Arnold Reisman, Raleigh, NC (US);

Jon Van Winkle, Durham, NC (US);

Assignee:

Duke University, Durham, NC (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B21K / ;
U.S. Cl.
CPC ...
761041 ; 76112 ;
Abstract

A method of making a microsurgical cutter from a flat planar substrate having a top surface and a bottom surface comprises the steps of (a) forming a photoresist mask layer on the top surface in the pattern of the microsurgical instrument, the mask layer having an edge portion formed in a predetermined pattern therein; and then (b) etching isotropically the top surface of the substrate through the top surface to the bottom surface so that the top surface and bottom surface meet at a cutting edge portion, with the cutting edge portion having a configuration corresponding to the edge portion of the mask layer. The substrates may be formed from semiconductor materials such as silicon, silicon carbide, sapphire and diamond.


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