The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 31, 1994

Filed:

Dec. 19, 1991
Applicant:
Inventors:

Greg A Peek, Beaverton, OR (US);

Craig D Cedros, Beaverton, OR (US);

Assignee:

Intel Corporation, Santa Clara, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F / ; G06F / ;
U.S. Cl.
CPC ...
395425 ; 364D / ; 395400 ; 395700 ;
Abstract

A circuit and a related process are utilized in a computer system for testing and configuring the width of various portions of memory in a memory array. The circuit captures a state of a memory width control signal (MEMCS16) during a test and configuration cycle, retains the state of the MEMCS16 signal for various blocks of memory, and controls the state of the MEMCS16 signal when a memory access to a particular memory block is made. The circuit tests the state of the MEMCS16 signal for various blocks of the system memory map and thereafter configures a memory control register appropriately. The state of the MEMCS16 signal is retained by a latch when a particular 128K region is accessed and a valid address is present on the address lines. The output of the latch is provided as a processor-readable test result in a bit of a control/test register.


Find Patent Forward Citations

Loading…